US Patent Issued to Horizon (Shanghai) Artificial Intelligence Technology on Feb. 14 for "Chip fault diagnosis method, chip fault diagnosis device, computer-readable storage medium and electronic equipment" (Chinese Inventor)

Media coverage

• Title	US Patent Issued to Horizon (Shanghai) Artificial Intelligence Technology on Feb. 14 for "Chip fault diagnosis method, chip fault diagnosis device, computer-readable storage medium and electronic equipment" (Chinese Inventor)
  Media name/outlet	US Fed News
  Country/Territory	United States
  Date	02/15/23
  Persons	Bin Zhang