Equipments Details
Description
The Helios G4 is a SEM with FIB capabilities. FIB is used to modify or machine materials at the micro and nanoscale; and to deposit material such as platinum, carbon, gold, etc. via ion beam induced deposition.
The FIB is also commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope.
The Helios G4 is equipped with a cryo stage that allows examination of specimens at very low temperature ( -180 deg.C).
Model: Helios
The FIB is also commonly used to prepare very thin samples (typically ~100 nanometers) for the transmission electron microscope.
The Helios G4 is equipped with a cryo stage that allows examination of specimens at very low temperature ( -180 deg.C).
Model: Helios
Details
| Name | Scanning Electron Microscope - DualBeam Helios |
|---|---|
| Acquisition date | 04/1/10 |
| Manufacturers | FEI Company |
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