TY - JOUR
T1 - 50V All-PMOS Charge Pumps Using Low-Voltage Capacitors
AU - Emira, Ahmed
AU - AbdelGhany, M.
AU - Elsayed, M.
AU - Elshurafa, Amro M.
AU - Sedky, S.
AU - Salama, Khaled N.
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2012/8/17
Y1 - 2012/8/17
N2 - In this work, two high-voltage charge pumps are introduced. In order to minimize the area of the pumping capacitors, which dominates the overall area of the charge pump, high density capacitors have been utilized. Nonetheless, these high density capacitors suffer from low breakdown voltage which is not compatible with the targeted high voltage application. To circumvent the breakdown limitation, a special clocking scheme is used to limit the maximum voltage across any pumping capacitor. The two charge pump circuits were fabricated in a 0:6m CMOS technology with poly0-poly1 capacitors. The output voltage of the two charge pumps reached 42:8V and 51V while the voltage across any capacitor did not exceed the value of the input voltage. Compared to other designs reported in the literature, the proposed charge pump provides the highest output voltage which makes it more suitable for tuning MEMS devices.
AB - In this work, two high-voltage charge pumps are introduced. In order to minimize the area of the pumping capacitors, which dominates the overall area of the charge pump, high density capacitors have been utilized. Nonetheless, these high density capacitors suffer from low breakdown voltage which is not compatible with the targeted high voltage application. To circumvent the breakdown limitation, a special clocking scheme is used to limit the maximum voltage across any pumping capacitor. The two charge pump circuits were fabricated in a 0:6m CMOS technology with poly0-poly1 capacitors. The output voltage of the two charge pumps reached 42:8V and 51V while the voltage across any capacitor did not exceed the value of the input voltage. Compared to other designs reported in the literature, the proposed charge pump provides the highest output voltage which makes it more suitable for tuning MEMS devices.
UR - http://hdl.handle.net/10754/247291
UR - http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6272344
UR - http://www.scopus.com/inward/record.url?scp=84878143570&partnerID=8YFLogxK
U2 - 10.1109/TIE.2012.2213674
DO - 10.1109/TIE.2012.2213674
M3 - Article
SN - 0278-0046
VL - 60
SP - 4683
EP - 4693
JO - IEEE Transactions on Industrial Electronics
JF - IEEE Transactions on Industrial Electronics
IS - 10
ER -