A complete digital optics applied to digital holographic microscopy: Application to chromatic aberration compensation

Tristan Colomb*, Florian Charrière, Jonas Kühn, Frédéric Montfort, Christian Depeursinge

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

In optics, optical elements are used to transform, to filter or to process physical wavefronts in order to magnify images, compensate for aberration or to suppress unwanted diffracted order for example. Because digital holography provides numerical wavefronts, we developed a digital optics, involving numerical elements such as numerical lenses and pinholes, to mimic numerically what is usually done physically, with the advantage to be able to define any shape for these elements and to place them everywhere without obstruction problems. We demonstrate that automatic and non-automatic procedures allow diffracted order or parasitic interferences filtering, compensation for aberration and image distortion, and control of position and magnification of reconstructed wavefront. We apply this digital optics to compensate for chromatic aberration in multi-wavelength holography in order to have perfect superposition between wavefronts reconstructed from digital hologram recorded with different wavelengths. This has a great importance for synthetic wavelength digital holography or tomographic digital holography that use multiple wavelengths.

Original languageEnglish (US)
Title of host publicationOptical Measurement Systems for Industrial Inspection V
EditionPART 1
DOIs
StatePublished - 2007
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection V - Munich, Germany
Duration: Jun 18 2007Jun 22 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
NumberPART 1
Volume6616
ISSN (Print)0277-786X

Other

OtherOptical Measurement Systems for Industrial Inspection V
Country/TerritoryGermany
CityMunich
Period06/18/0706/22/07

Keywords

  • Aberration compensation
  • Digital holography
  • Microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Applied Mathematics
  • Electrical and Electronic Engineering
  • Computer Science Applications

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