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A conductive AFM nanoscale analysis of NBTI and channel hot-carrier degradation in MOSFETs
Qian Wu, Albin Bayerl, Marc Porti, Javier Martin-Martinez, Mario Lanza, Rosana Rodriguez, Vikas Velayudhan, Montserrat Nafria, Xavier Aymerich, Mireia Bargallo Gonzalez, Eddy Simoen
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations