A fast and parallel stroud-based stochastic collocation method for statistical EMI/EMC analysis

Hakan Bagci; Caglar Yavuz; Abdulkadir C. Yucel; Jan S. Hesthaven; Eric Michielssen

doi:10.1109/ISEMC.2008.4652151

A fast and parallel stroud-based stochastic collocation method for statistical EMI/EMC analysis

Hakan Bagci, Caglar Yavuz, Abdulkadir C. Yucel, Jan S. Hesthaven, Eric Michielssen

Research output: Contribution to conference › Paper › peer-review

4 Scopus citations

Abstract

A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.

Original language	English (US)
DOIs	https://doi.org/10.1109/ISEMC.2008.4652151
State	Published - 2008
Event	2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, MI, Germany Duration: Aug 18 2008 → Aug 22 2008

Conference

Conference	2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008
Country/Territory	Germany
City	Detroit, MI
Period	08/18/08 → 08/22/08

Keywords

electromagnetic coupling
electromagnetic interference and compatibility
fast solvers
hybrid solvers
parallelization
stochastic collocation
Stroud integration rules
time domain integral equations

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/ISEMC.2008.4652151

Cite this

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title = "A fast and parallel stroud-based stochastic collocation method for statistical EMI/EMC analysis",

abstract = "A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.",

keywords = "electromagnetic coupling, electromagnetic interference and compatibility, fast solvers, hybrid solvers, parallelization, stochastic collocation, Stroud integration rules, time domain integral equations",

author = "Hakan Bagci and Caglar Yavuz and Yucel, {Abdulkadir C.} and Hesthaven, {Jan S.} and Eric Michielssen",

note = "Publisher Copyright: {\textcopyright} 2008 IEEE.; 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 ; Conference date: 18-08-2008 Through 22-08-2008",

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T1 - A fast and parallel stroud-based stochastic collocation method for statistical EMI/EMC analysis

AU - Bagci, Hakan

AU - Yavuz, Caglar

AU - Yucel, Abdulkadir C.

AU - Hesthaven, Jan S.

AU - Michielssen, Eric

PY - 2008

Y1 - 2008

N2 - A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.

AB - A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.

KW - electromagnetic coupling

KW - electromagnetic interference and compatibility

KW - fast solvers

KW - hybrid solvers

KW - parallelization

KW - stochastic collocation

KW - Stroud integration rules

KW - time domain integral equations

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DO - 10.1109/ISEMC.2008.4652151

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AN - SCOPUS:84890908951

T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008

Y2 - 18 August 2008 through 22 August 2008

ER -

A fast and parallel stroud-based stochastic collocation method for statistical EMI/EMC analysis

Abstract

Conference

Keywords

ASJC Scopus subject areas

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