Abstract
A fast stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on electrically large and loaded platforms is presented. Uncertainties in electromagnetic excitations and/or system geometries and configurations are parameterized in terms of random variables having normal or beta probability density functions. A fast time-domain integral-equation-based field-cable-circuit simulator is used to perform deterministic EMI/EMC simulations for excitations and/or system geometries and configurations specified by Stroud integration rules. Outputs of these simulations then are processed to compute averages and standard deviations of pertinent observables. The proposed Stroud-based collocation method requires far fewer deterministic simulations than Monte Carlo or tensor-product integrators. To demonstrate the accuracy, efficiency, and practicality of the proposed method, it is used to statistically characterize coupled voltages at the feed pins of cable-interconnected and shielded computer cards as well as the terminals of cables situated inside the bay of an airplane cockpit.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 301-311 |
| Number of pages | 11 |
| Journal | IEEE Transactions on Electromagnetic Compatibility |
| Volume | 51 |
| Issue number | 2 |
| DOIs | |
| State | Published - 2009 |
Keywords
- Electromagnetic coupling
- Electromagnetic interference and compatibility (EMI/EMC)
- Fast solvers
- Hybrid simulators
- Stochastic collocation
- Stroud integration rules
- Time-domain integral equations
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering