A high-sensitivity photon counting imaging system (PCIS) for luminescence analysis

I. McCulloch, N. A. Spooner*, D. Jones

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

The Photon Counting Imaging System (PCIS) has been developed to extend the capabilities of traditional luminescence dating technologies by providing a spatially-resolved (imaged) output and a significantly extended spectral range for the detection of luminescence signals, at an overall sensitivity comparable to that of non-imaging luminescence detectors. It is capable of a wide range of both luminescence dating and materials analysis applications, utilising a variety of optical stimulation sources in addition to thermal stimulation, and incorporates easily inter-changeable optical filters for the spectral discrimination of luminescence emissions.

Original languageEnglish (US)
Pages (from-to)1566-1570
Number of pages5
JournalRadiation Measurements
Volume46
Issue number12
DOIs
StatePublished - Dec 2011
Externally publishedYes

Keywords

  • IRSL
  • Luminescence imaging
  • OSL
  • Offner
  • Single grain dating
  • TL

ASJC Scopus subject areas

  • Radiation
  • Instrumentation

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