Abstract
In this paper we present a macro-model for a true random number generator which internally exploits a pipeline analog-to-digital converter modified to operate as an interleaved chaotic map. The model is tuned to reproduce the non-idealities of a 0.35μm CMOS double-poly triple-metal technology. It is based on circuit-level simulations but is extremely more efficient and can be used to run the statistical tests to assure the quality of the output stream. © 2005 IEEE.
Original language | English (US) |
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Title of host publication | Proceedings - IEEE International Symposium on Circuits and Systems |
Pages | 4349-4352 |
Number of pages | 4 |
DOIs | |
State | Published - Dec 1 2005 |
Externally published | Yes |