A review on resistive switching in high-k dielectrics: A nanoscale point of view using conductive atomic force microscope

Keyphrases

• Resistive Switching 100%
• Resistive Random Access Memory (ReRAM) 100%
• High-k Dielectric 100%
• Conductive Atomic Force Microscopy (C-AFM) 100%
• Resistance Switching 50%
• Device Level 50%
• Electrical Resistance 50%
• Microscopic Analysis 50%
• Unusual Properties 50%
• Insulating Layer 50%
• Metal-insulator-metal Structure 50%
• Electrical Stress 50%
• Characterization Tools 50%
• Charge Storage 50%
• Low Resistance State 50%
• Information Storage 50%
• Memory Concept 50%
• High-k Material 50%
• Lateral Spatial Resolution 50%
• High Resistive State 50%

Engineering

• Conductive 100%
• Atomic Force Microscope 100%
• Resistive 100%
• Dielectrics 100%
• Nanoscale 100%
• Resistive Random Access Memory 66%
• Metal-Insulator-Metal 33%
• Insulating Layer 33%
• Charge Storage 33%
• Point Memory 33%
• Low Resistive State 33%
• Spatial Resolution 33%

Material Science

• Dielectric Material 100%
• Resistive Random-Access Memory 100%
• Microscopy 50%
• Metal-Insulator-Metal Structure 50%
• Electrical Resistance 50%