A Surface Integral Equation-Based Sub-Structure Characteristic Mode Analysis Method for Printed Circuit Structures

Yuyu Lu, Ran Zhao, Kun Fan, Guangshang Cheng, Zhixiang Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, the electric field integral equation coupled Poggio-Miller-Chang-Harrington-Wu-Tsai equation-based sub-structure characteristic mode (CM) formulation is proposed to analyze the resonant behaviors of printed circuit structures. Superior to the full-structure (sub-structure) volume-surface integral equation (VSIE)-based CM analysis method, the surface integral equation (SIE)-based CM analysis method only needs the surface discretization of targets. The proposed method greatly reduces computational cost, and numerical examples validate its accuracy.
Original languageEnglish (US)
Title of host publication2022 International Applied Computational Electromagnetics Society Symposium (ACES-China)
PublisherIEEE
ISBN (Print)9781665452366
DOIs
StatePublished - Mar 20 2023

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