Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy

A. Konečná; A. A. Govyadinov; T. Neuman; A. Chuvilin; S. Vélez; I. Dolado; Sergei Lopatin; A. Y. Nikitin; F. Casanova; L. E. Hueso; R. Hillenbrand; J. Aizpurua

doi:10.1017/s1431927618002532

Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy

A. Konečná, A. A. Govyadinov, T. Neuman, A. Chuvilin, S. Vélez, I. Dolado, Sergei Lopatin, A. Y. Nikitin, F. Casanova, L. E. Hueso, R. Hillenbrand, J. Aizpurua

Research output: Contribution to journal › Article › peer-review

Abstract

Only recently, specially designed instrumentation for spatially-resolved electron energy-loss spectroscopy (EELS) has been developed to increase the attainable spectral resolution and the operating spectral range [1]. This progress has dramatically broadened the potential for applications of EELS for probing low-loss vibrational excitations. Pioneering experiments have demonstrated the capability of the fast electrons in Scanning Transmission Electron Microscopy (STEM) to probe vibrational fingerprints in organic samples [2], ionic crystals [3], and also in van der Waals materials [4].

Original language	English (US)
Pages (from-to)	408-409
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	24
Issue number	S1
DOIs	https://doi.org/10.1017/s1431927618002532
State	Published - Aug 6 2018

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Instrumentation

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Konečná, A., Govyadinov, A. A., Neuman, T., Chuvilin, A., Vélez, S., Dolado, I., Lopatin, S., Nikitin, A. Y., Casanova, F., Hueso, L. E., Hillenbrand, R., & Aizpurua, J. (2018). Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy. Microscopy and Microanalysis, 24(S1), 408-409. https://doi.org/10.1017/s1431927618002532

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title = "Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy",

abstract = "Only recently, specially designed instrumentation for spatially-resolved electron energy-loss spectroscopy (EELS) has been developed to increase the attainable spectral resolution and the operating spectral range [1]. This progress has dramatically broadened the potential for applications of EELS for probing low-loss vibrational excitations. Pioneering experiments have demonstrated the capability of the fast electrons in Scanning Transmission Electron Microscopy (STEM) to probe vibrational fingerprints in organic samples [2], ionic crystals [3], and also in van der Waals materials [4].",

author = "A. Kone{\v c}n{\'a} and Govyadinov, {A. A.} and T. Neuman and A. Chuvilin and S. V{\'e}lez and I. Dolado and Sergei Lopatin and Nikitin, {A. Y.} and F. Casanova and Hueso, {L. E.} and R. Hillenbrand and J. Aizpurua",

note = "KAUST Repository Item: Exported on 2021-03-08",

year = "2018",

month = aug,

day = "6",

doi = "10.1017/s1431927618002532",

language = "English (US)",

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journal = "Microscopy and Microanalysis",

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Konečná, A, Govyadinov, AA, Neuman, T, Chuvilin, A, Vélez, S, Dolado, I, Lopatin, S, Nikitin, AY, Casanova, F, Hueso, LE, Hillenbrand, R & Aizpurua, J 2018, 'Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy', Microscopy and Microanalysis, vol. 24, no. S1, pp. 408-409. https://doi.org/10.1017/s1431927618002532

TY - JOUR

T1 - Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy

AU - Konečná, A.

AU - Govyadinov, A. A.

AU - Neuman, T.

AU - Chuvilin, A.

AU - Vélez, S.

AU - Dolado, I.

AU - Lopatin, Sergei

AU - Nikitin, A. Y.

AU - Casanova, F.

AU - Hueso, L. E.

AU - Hillenbrand, R.

AU - Aizpurua, J.

N1 - KAUST Repository Item: Exported on 2021-03-08

PY - 2018/8/6

Y1 - 2018/8/6

N2 - Only recently, specially designed instrumentation for spatially-resolved electron energy-loss spectroscopy (EELS) has been developed to increase the attainable spectral resolution and the operating spectral range [1]. This progress has dramatically broadened the potential for applications of EELS for probing low-loss vibrational excitations. Pioneering experiments have demonstrated the capability of the fast electrons in Scanning Transmission Electron Microscopy (STEM) to probe vibrational fingerprints in organic samples [2], ionic crystals [3], and also in van der Waals materials [4].

AB - Only recently, specially designed instrumentation for spatially-resolved electron energy-loss spectroscopy (EELS) has been developed to increase the attainable spectral resolution and the operating spectral range [1]. This progress has dramatically broadened the potential for applications of EELS for probing low-loss vibrational excitations. Pioneering experiments have demonstrated the capability of the fast electrons in Scanning Transmission Electron Microscopy (STEM) to probe vibrational fingerprints in organic samples [2], ionic crystals [3], and also in van der Waals materials [4].

UR - http://hdl.handle.net/10754/667935

UR - https://www.cambridge.org/core/product/identifier/S1431927618002532/type/journal_article

U2 - 10.1017/s1431927618002532

DO - 10.1017/s1431927618002532

M3 - Article

SN - 1431-9276

VL - 24

SP - 408

EP - 409

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S1

ER -

Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy

Abstract

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