AFM-induced amine deprotection: Triggering localized bond cleavage by application of tip/substrate voltage bias for the surface self-assembly of nanosized dendritic objects

Zachary M. Fresco, Itai Suez, Scott A. Backer, Jean M.J. Fréchet*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

38 Scopus citations

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Material Science