ALD of advanced high-k and metal gate stacks for MOS devices

James Gutt, Sundar Gopalan, George A. Brown, Paul D. Kirsch, Jeff J. Peterson, Mark I. Gardner, Hong Jyh Li, Patrick Lysaght, Husam N. Alshareef, Kisik Choi, Craig Huffinan, Huang Chun Wen, Prashant Majhi, Byoung Hun Lee, Hood Chatham, Seung Park, Sidi Lanee, Lawrence Bartholomew, Yoshihide Senzaki*

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Fingerprint

Dive into the research topics of 'ALD of advanced high-k and metal gate stacks for MOS devices'. Together they form a unique fingerprint.

Material Science

Keyphrases