TY - GEN
T1 - Analysis and demonstration of MEM-relay power gating
AU - Fariborzi, Hossein
AU - Spencer, Matthew
AU - Karkare, Vaibhav
AU - Jeon, Jaeseok
AU - Nathanael, Rhesa
AU - Wang, Chengcheng
AU - Chen, Fred
AU - Kam, Hei
AU - Pott, Vincent
AU - Liu, Tsu Jae King
AU - Alon, Elad
AU - Stojanović, Vladimir
AU - Marković, Dejan
PY - 2010
Y1 - 2010
N2 - This paper shows that due to their negligibly low leakage, in certain applications, chips utilizing power gates built even with today's relatively large, high-voltage micro-electro-mechanical (MEM) relays can achieve lower total energy than those built with CMOS transistors. A simple analysis provides design guidelines for off-time and savings estimates as a function of technology parameters, and quantifies the further benefits of scaled relay designs. Finally, we demonstrate a relay chip successfully power-gating a CMOS chip, and show a relay-based timer suitable for self-timed operation.
AB - This paper shows that due to their negligibly low leakage, in certain applications, chips utilizing power gates built even with today's relatively large, high-voltage micro-electro-mechanical (MEM) relays can achieve lower total energy than those built with CMOS transistors. A simple analysis provides design guidelines for off-time and savings estimates as a function of technology parameters, and quantifies the further benefits of scaled relay designs. Finally, we demonstrate a relay chip successfully power-gating a CMOS chip, and show a relay-based timer suitable for self-timed operation.
UR - http://www.scopus.com/inward/record.url?scp=78649834507&partnerID=8YFLogxK
U2 - 10.1109/CICC.2010.5617380
DO - 10.1109/CICC.2010.5617380
M3 - Conference contribution
AN - SCOPUS:78649834507
SN - 9781424457588
T3 - Proceedings of the Custom Integrated Circuits Conference
BT - IEEE Custom Integrated Circuits Conference 2010, CICC 2010
T2 - 32nd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2010
Y2 - 19 September 2010 through 22 September 2010
ER -