Abstract
This brief provides a detailed analysis of active pixel sensor, pixel and column circuit. Surprisingly, we find that shorter readout times can be achieved by reducing the bias current and hence reducing energy consumption. We investigate the effect of nonidealities on the readout operation. We find that when the follower transistor channel-length modulation is taken into consideration, delay is reduced, which implies that shorter length transistors can be used in the pixel. We show that readout time decreases linearly with technology scaling.
Original language | English (US) |
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Pages (from-to) | 941-944 |
Number of pages | 4 |
Journal | IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications |
Volume | 50 |
Issue number | 7 |
DOIs | |
State | Published - Jul 2003 |
Externally published | Yes |
Keywords
- Active pixel sensor (APS)
- CMOS image sensor
- High-speed imaging
- Readout electronics
ASJC Scopus subject areas
- Electrical and Electronic Engineering