TY - GEN
T1 - Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)
AU - Gemma, Ryota
AU - Al-Kassab, Tala'at
AU - Kirchheim, Reiner
AU - Pundt, Astrid A.
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2011/9
Y1 - 2011/9
N2 - V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.
AB - V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.
UR - http://hdl.handle.net/10754/564421
UR - https://linkinghub.elsevier.com/retrieve/pii/S0925838810028859
UR - http://www.scopus.com/inward/record.url?scp=80052799128&partnerID=8YFLogxK
U2 - 10.1016/j.jallcom.2010.11.122
DO - 10.1016/j.jallcom.2010.11.122
M3 - Conference contribution
SP - S872-S876
BT - Journal of Alloys and Compounds
PB - Elsevier BV
ER -