Abstract
This paper evaluates the operation of self-correcting active pixel sensors presented in [6] using Signal-to-Noise Ratio. The evaluation is based on a simplified Active Pixel Sensing (APS) model. We show that in the absence of stuck faults (i.e., no errors) the performance of the system suffers from considerable degradation especially at low illumination (i.e., typical indoor scenes). We use the same model to quantify the number of defective pixels under which self correction is beneficial.
Original language | English (US) |
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Article number | 30 |
Pages (from-to) | 262-269 |
Number of pages | 8 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5668 |
DOIs | |
State | Published - 2005 |
Externally published | Yes |
Event | Proceedings of SPIE-IS and T Electronic Imaging - Image Quality and System Performance II - San Jose, CA, United States Duration: Jan 18 2005 → Jan 20 2005 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering