Assessment and improvement of the pattern recognition performance of memdiode-based cross-point arrays with randomly distributed stuck-at-faults

INIS

• pattern recognition 100%
• performance 100%
• assessments 100%
• equations 100%
• devices 66%
• simulation 66%
• mapping 66%
• images 66%
• layers 33%
• monte carlo method 33%
• transport 33%
• electrons 33%
• humans 33%
• modeling 33%
• voltage 33%
• weight 33%
• accuracy 33%
• spices 33%
• datasets 33%
• hands 33%

Computer Science

• Memristor 100%
• Recognition Performance 100%
• Pattern Recognition 100%
• Models 100%
• Diode 50%
• Mapping Scheme 50%
• Series Resistance 50%
• Synaptic Weight 50%
• Multilayer Perceptron 50%
• Internal Memory 50%
• Line Parameter 50%
• Simulation 50%
• Functions 50%
• Standards 50%
• Roles 50%
• Accuracy 50%