TY - JOUR
T1 - Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials
AU - Zhang, Daliang
AU - Zhu, Yihan
AU - Liu, Lingmei
AU - Ying, Xiangrong
AU - Hsiung, Chia-En
AU - Sougrat, Rachid
AU - Li, Kun
AU - Han, Yu
N1 - KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): URF/1/2570-01, FCC/1/1972-19
Acknowledgements: We thank M. Pan and O. Terasaki for helpful discussions. This work was supported by King Abdullah University of Science and Technology through Competitive Research Grant (URF/1/2570-01) and Center Competitive Funding (FCC/1/1972-19). HRTEM images presented in this paper and the two programs used for zone axis alignment and image alignment are archived in a data repository (https://zenodo.org/record/1133206) for verification purposes only. Interested readers can download the programs after agreeing with the terms and conditions stated there. D. Z., Y. Z., K. L., and Y. H. are inventors on United States Provisional patent applications (62/490,967 and 62/490,968) submitted by King Abdullah University of Science and Technology that cover the methods for crystal zone axis alignment and image alignment.
PY - 2018/1/18
Y1 - 2018/1/18
N2 - High-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determination of the defocus value. We develop a suite of methods to fulfill these requirements and acquire atomic-resolution TEM images of several metal organic frameworks that are generally recognized as highly sensitive to electron beams. The high image resolution allows us to identify individual metal atomic columns, various types of surface termination, and benzene rings in the organic linkers. We also apply our methods to other electron beam–sensitive materials, including the organic-inorganic hybrid perovskite CH3NH3PbBr3.
AB - High-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determination of the defocus value. We develop a suite of methods to fulfill these requirements and acquire atomic-resolution TEM images of several metal organic frameworks that are generally recognized as highly sensitive to electron beams. The high image resolution allows us to identify individual metal atomic columns, various types of surface termination, and benzene rings in the organic linkers. We also apply our methods to other electron beam–sensitive materials, including the organic-inorganic hybrid perovskite CH3NH3PbBr3.
UR - http://hdl.handle.net/10754/626889
UR - http://science.sciencemag.org/content/early/2018/01/17/science.aao0865
UR - http://www.scopus.com/inward/record.url?scp=85040862785&partnerID=8YFLogxK
U2 - 10.1126/science.aao0865
DO - 10.1126/science.aao0865
M3 - Article
C2 - 29348363
AN - SCOPUS:85040862785
SN - 0036-8075
VL - 359
SP - 675
EP - 679
JO - Science (New York, N.Y.)
JF - Science (New York, N.Y.)
IS - 6376
ER -