Barrier height of Pt–In[sub x]Ga[sub 1−x]N (0≤x≤0.5) nanowire Schottky diodes

Wei Guo, Animesh Banerjee, Meng Zhang, Pallab Bhattacharya

Research output: Contribution to journalArticlepeer-review

15 Scopus citations


The barrier height of Schottky diodes made on Inx Ga 1-x N nanowires have been determined from capacitance-voltage measurements. The nanowires were grown undoped on n-type (001) silicon substrates by plasma-assisted molecular beam epitaxy. The length, diameter and density of the nanowires are ∼1 μm, 20 nm, and 1× 1011 cm-2. The Schottky contact was made on the top surface of the nanowires with Pt after planarizing with parylene. The measured barrier height B varies from 1.4 eV (GaN) to 0.44 eV (In0.5 Ga0.5 N) and agrees well with the ideal barrier heights in the Schottky limit. © 2011 American Institute of Physics.
Original languageEnglish (US)
Pages (from-to)183116
JournalApplied Physics Letters
Issue number18
StatePublished - May 6 2011
Externally publishedYes


Dive into the research topics of 'Barrier height of Pt–In[sub x]Ga[sub 1−x]N (0≤x≤0.5) nanowire Schottky diodes'. Together they form a unique fingerprint.

Cite this