BEOL test chip for rapid technology and process integration debugging

Keyphrases

• Technology Integration 100%
• Rapid Process 100%
• Rapid Technology 100%
• Short Flow 33%
• Failure Correlation 33%
• Learning Cycle 33%
• Manufacturing Improvement 33%
• Design for Manufacturing 33%
• Random Failure 33%
• Technological Breakthrough 33%
• Scheme Analysis 33%
• Systematic Failure 33%
• Fast Testing 33%
• Improvement Process 33%

Engineering

• Process Integration 100%
• Process Development 100%
• Technology Integration 100%
• Process Performance 33%
• Electrical Measurement 33%
• Infrastructure 33%
• Process Improvement 33%
• Processing Method 33%
• Systematic Failure 33%
• Random Failure 33%
• Defects 33%
• Design for Manufacture 33%
• Failure Mode 33%