Change of microstructure of polyimide thin films under the action of supercritical carbon dioxide and its influence on dielectric constant

I. A. Ronova; M. Bruma; O. V. Sinitsyna; I. Sava; A. Yu Nikolaev; Stefan Chisca; N. G. Ryvkina

doi:10.1007/s11224-014-0443-1

Change of microstructure of polyimide thin films under the action of supercritical carbon dioxide and its influence on dielectric constant

I. A. Ronova^*, M. Bruma, O. V. Sinitsyna, I. Sava, A. Yu Nikolaev, Stefan Chisca, N. G. Ryvkina

^*Corresponding author for this work

Water Desalination & Reuse Center

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

A series of polyimide films, whose repeating units had different contents of fluorine atoms in the structure, was subjected to swelling in supercritical carbon dioxide. The greatest increase in the free volume was 257 % of the initial value. This led to the formation of foams and reduction of the dielectric constant even below 1.5.

Original language	English (US)
Pages (from-to)	1687-1694
Number of pages	8
Journal	Structural Chemistry
Volume	25
Issue number	6
DOIs	https://doi.org/10.1007/s11224-014-0443-1
State	Published - Jan 1 2014

Keywords

Conformational parameters
Dielectric constant
Free volume
Microstructure
Polyimide
Supercritical carbon dioxide

ASJC Scopus subject areas

Condensed Matter Physics
Physical and Theoretical Chemistry

Access to Document

10.1007/s11224-014-0443-1

Cite this

@article{2f331dd50eab4c26a902ba898b8d5866,

title = "Change of microstructure of polyimide thin films under the action of supercritical carbon dioxide and its influence on dielectric constant",

abstract = "A series of polyimide films, whose repeating units had different contents of fluorine atoms in the structure, was subjected to swelling in supercritical carbon dioxide. The greatest increase in the free volume was 257 % of the initial value. This led to the formation of foams and reduction of the dielectric constant even below 1.5.",

keywords = "Conformational parameters, Dielectric constant, Free volume, Microstructure, Polyimide, Supercritical carbon dioxide",

author = "Ronova, {I. A.} and M. Bruma and Sinitsyna, {O. V.} and I. Sava and Nikolaev, {A. Yu} and Stefan Chisca and Ryvkina, {N. G.}",

year = "2014",

month = jan,

day = "1",

doi = "10.1007/s11224-014-0443-1",

language = "English (US)",

volume = "25",

pages = "1687--1694",

journal = "Structural Chemistry",

issn = "1040-0400",

publisher = "Springer Verlag",

number = "6",

}

TY - JOUR

T1 - Change of microstructure of polyimide thin films under the action of supercritical carbon dioxide and its influence on dielectric constant

AU - Ronova, I. A.

AU - Bruma, M.

AU - Sinitsyna, O. V.

AU - Sava, I.

AU - Nikolaev, A. Yu

AU - Chisca, Stefan

AU - Ryvkina, N. G.

PY - 2014/1/1

Y1 - 2014/1/1

N2 - A series of polyimide films, whose repeating units had different contents of fluorine atoms in the structure, was subjected to swelling in supercritical carbon dioxide. The greatest increase in the free volume was 257 % of the initial value. This led to the formation of foams and reduction of the dielectric constant even below 1.5.

AB - A series of polyimide films, whose repeating units had different contents of fluorine atoms in the structure, was subjected to swelling in supercritical carbon dioxide. The greatest increase in the free volume was 257 % of the initial value. This led to the formation of foams and reduction of the dielectric constant even below 1.5.

KW - Conformational parameters

KW - Dielectric constant

KW - Free volume

KW - Microstructure

KW - Polyimide

KW - Supercritical carbon dioxide

UR - http://www.scopus.com/inward/record.url?scp=84939890128&partnerID=8YFLogxK

U2 - 10.1007/s11224-014-0443-1

DO - 10.1007/s11224-014-0443-1

M3 - Article

AN - SCOPUS:84939890128

SN - 1040-0400

VL - 25

SP - 1687

EP - 1694

JO - Structural Chemistry

JF - Structural Chemistry

IS - 6

ER -

Change of microstructure of polyimide thin films under the action of supercritical carbon dioxide and its influence on dielectric constant

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this