Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

A. Bayer, M. Porti, J. Martin-Martinez, M. Lanza, R. Rodriguez, V. Velayudhan, E. Amat, M. Nafria, X. Aymerich, M. B. Gonzalez, E. Simoen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution