Abstract
p-type ZnSe layers have been grown by molecular beam epitaxy using nitrogen radical doping. We have employed Pt as the electrode material for p-type ZnSe. The Pt electrodes markedly reduced contact resistances. The p-type conduction was confirmed by Hall measurement. Carrier concentration was 4.4 x 1015 cm-3. Hall mobility was as high as 86 cm2/V-s because of good crystallinity. The p-type ZnSe layers exhibited the 2.616-eV emission from recombination between free electrons and acceptor holes (FA) in room-temperature photoluminescence measurement. The FA emission provides evidence that the layers are p-type ZnSe.
Original language | English (US) |
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Pages (from-to) | L152-L155 |
Journal | Japanese Journal of Applied Physics |
Volume | 30 |
Issue number | 2 |
DOIs | |
State | Published - Feb 1991 |
Externally published | Yes |
Keywords
- Hall measurement
- P-type
- Photoluminescence
- Pt electrode
- ZnSe
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy