Characterization of Y2SiO5:Ce thin films

E. Coetsee, H. C. Swart*, J. J. Terblans, O. M. Ntwaeaborwa, K. T. Hillie, W. A. Jordaan, Ulrich Buttner

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    17 Scopus citations


    Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.

    Original languageEnglish (US)
    Pages (from-to)1338-1343
    Number of pages6
    JournalOptical Materials
    Issue number11
    StatePublished - Jan 1 2007


    • AFM
    • Cathodoluminescence
    • EDS
    • PLD
    • SEM
    • Thin films
    • XRD
    • YSiO:Ce

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Computer Science(all)
    • Atomic and Molecular Physics, and Optics
    • Spectroscopy
    • Physical and Theoretical Chemistry
    • Organic Chemistry
    • Inorganic Chemistry
    • Electrical and Electronic Engineering


    Dive into the research topics of 'Characterization of Y2SiO5:Ce thin films'. Together they form a unique fingerprint.

    Cite this