Charge transfer dynamics in Cu-doped ZnO nanowires

Guozhong Xing; Guichuan Xing; Mingjie Li; Edbert Jarvis Sie; Dandan Wang; Arief Sulistio; Quan Lin Ye; Cheng Hon Alfred Huan; Tom Wu; Tze Chien Sum

doi:10.1063/1.3558912

Charge transfer dynamics in Cu-doped ZnO nanowires

Guozhong Xing^*, Guichuan Xing^*, Mingjie Li, Edbert Jarvis Sie, Dandan Wang, Arief Sulistio, Quan Lin Ye, Cheng Hon Alfred Huan, Tom Wu, Tze Chien Sum

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

64 Scopus citations

Abstract

Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39±9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.

Original language	English (US)
Article number	102105
Journal	Applied Physics Letters
Volume	98
Issue number	10
DOIs	https://doi.org/10.1063/1.3558912
State	Published - Mar 7 2011
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3558912

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title = "Charge transfer dynamics in Cu-doped ZnO nanowires",

abstract = "Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39±9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.",

author = "Guozhong Xing and Guichuan Xing and Mingjie Li and Sie, {Edbert Jarvis} and Dandan Wang and Arief Sulistio and Ye, {Quan Lin} and Huan, {Cheng Hon Alfred} and Tom Wu and Sum, {Tze Chien}",

note = "Funding Information: This work is supported by the following research grants (SUG Grant No. M58110068, MOE AcRF Tier 2 Grant No. T207B1217, SUG 20/06, and RG 46/07). G. Z. Xing acknowledges the financial support of Singapore Millennium Foundation, Singapore. Guozhong Xing and Guichuan Xing contributed equally to this work.",

year = "2011",

month = mar,

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doi = "10.1063/1.3558912",

language = "English (US)",

volume = "98",

journal = "Applied Physics Letters",

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T1 - Charge transfer dynamics in Cu-doped ZnO nanowires

AU - Xing, Guozhong

AU - Xing, Guichuan

AU - Li, Mingjie

AU - Sie, Edbert Jarvis

AU - Wang, Dandan

AU - Sulistio, Arief

AU - Ye, Quan Lin

AU - Huan, Cheng Hon Alfred

AU - Wu, Tom

AU - Sum, Tze Chien

N1 - Funding Information: This work is supported by the following research grants (SUG Grant No. M58110068, MOE AcRF Tier 2 Grant No. T207B1217, SUG 20/06, and RG 46/07). G. Z. Xing acknowledges the financial support of Singapore Millennium Foundation, Singapore. Guozhong Xing and Guichuan Xing contributed equally to this work.

PY - 2011/3/7

Y1 - 2011/3/7

N2 - Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39±9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.

AB - Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39±9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.

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U2 - 10.1063/1.3558912

DO - 10.1063/1.3558912

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VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

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M1 - 102105

ER -

Charge transfer dynamics in Cu-doped ZnO nanowires

Abstract

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