Charge transfer dynamics in Cu-doped ZnO nanowires

Guozhong Xing*, Guichuan Xing*, Mingjie Li, Edbert Jarvis Sie, Dandan Wang, Arief Sulistio, Quan Lin Ye, Cheng Hon Alfred Huan, Tom Wu, Tze Chien Sum

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

63 Scopus citations


Time resolved photoluminescence (TRPL) and transient absorption (TA) spectroscopy reveal an ultrafast charge transfer (CT) process, with an electron localization time constant 39±9 ps, between the ZnO host and the Cu dopants in Cu-doped ZnO nanowires. This CT process effectively competes with the ZnO band edge emission, resulting in the quenching of the ZnO UV emission. TRPL measurements show that the UV decay dynamics coincides with the buildup of the Cu-related green emission. TA measurements probing the state-filling of the band edge and defect states provide further support to the CT model where the bleaching dynamics concur with the TRPL lifetimes.

Original languageEnglish (US)
Article number102105
JournalApplied Physics Letters
Issue number10
StatePublished - Mar 7 2011
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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