Abstract
Copper thiocyanate (CuSCN) is a p-type semiconductor that exhibits hole-transport and wide-band gap (∼3.9 eV) characteristics. However, the conductivity of CuSCN is not sufficiently high, which limits its potential application in optoelectronic devices. Herein, CuSCN thin films were exposed to chlorine using a dry etching system to enhance their electrical properties, yielding a maximum hole concentration of 3 × 1018 cm-3. The p-type CuSCN layer was then deposited onto an n-type gallium nitride (GaN) layer to form a prototypical ultraviolet-based photodetector. X-ray photoelectron spectroscopy further demonstrated the interface electronic structures of the heterojunction, confirming a favorable alignment for holes and electrons transport. The ensuing p-CuSCN/n-GaN heterojunction photodetector exhibited a turn-on voltage of 2.3 V, a responsivity of 1.35 A/W at -1 V, and an external quantum efficiency of 5.14 × 102% under illumination with ultraviolet light (peak wavelength of 330 nm). The work opens a new pathway for making a plethora of hybrid optoelectronic devices of inorganic and organic nature by using p-type CuSCN as the hole injection layer.
Original language | English (US) |
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Pages (from-to) | 17889-17898 |
Number of pages | 10 |
Journal | ACS Applied Materials and Interfaces |
Volume | 14 |
Issue number | 15 |
DOIs | |
State | Published - Apr 20 2022 |
Keywords
- copper thiocyanate
- gallium nitride
- p-CuSCN/n-GaN heterojunction photodetector
- ultraviolet-based photodetector
- X-ray photoelectron spectroscopy
ASJC Scopus subject areas
- General Materials Science