Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

W. J. Fan, S. F. Yoon, T. K. Ng, S. Z. Wang, W. K. Loke, R. Liu, A. Wee

Research output: Contribution to journal › Article › peer-review

68 Scopus citations

Fingerprint

Dive into the research topics of 'Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy'. Together they form a unique fingerprint.

Material Science

Physics

Keyphrases