TY - GEN
T1 - Complex oscillation based test of analog filters
AU - Callegari, Sergio
AU - Setti, Gianluca
AU - Soma, Mani
N1 - Generated from Scopus record by KAUST IRTS on 2023-02-15
PY - 2009/10/26
Y1 - 2009/10/26
N2 - Costs and difficulties associated to testing can be an Achilles' heel for modern large-scale mixed-mode systems. Here, a low-overhead technique is introduced to enable the design of analog filters capable of checking their own parameters. The approach can also be applied to add such functionality to existing filter designs. The case of a Switched-Capacitor 2nd order Band-pass stage is used for illustration. The approach is based on the recently introduced Complex Oscillation Based Test methodology and permits to appreciate not just deviations in characteristic frequencies, but also the merit factor (and thus bandwidth and roll-off). ©2009 IEEE.
AB - Costs and difficulties associated to testing can be an Achilles' heel for modern large-scale mixed-mode systems. Here, a low-overhead technique is introduced to enable the design of analog filters capable of checking their own parameters. The approach can also be applied to add such functionality to existing filter designs. The case of a Switched-Capacitor 2nd order Band-pass stage is used for illustration. The approach is based on the recently introduced Complex Oscillation Based Test methodology and permits to appreciate not just deviations in characteristic frequencies, but also the merit factor (and thus bandwidth and roll-off). ©2009 IEEE.
UR - http://ieeexplore.ieee.org/document/5118397/
UR - http://www.scopus.com/inward/record.url?scp=70350159241&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2009.5118397
DO - 10.1109/ISCAS.2009.5118397
M3 - Conference contribution
SN - 9781424438280
SP - 2854
EP - 2857
BT - Proceedings - IEEE International Symposium on Circuits and Systems
ER -