Control charts and efficient sampling methodologies in the field of photovoltaics

C. Allebé, B. Govaerts, Emmanuel Van Kerschaver*, S. De Wolf, J. Szlufcik

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

Original languageEnglish (US)
Pages (from-to)387-390
Number of pages4
JournalConference Record of the IEEE Photovoltaic Specialists Conference
StatePublished - 2002
Externally publishedYes
Event29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States
Duration: May 19 2002May 24 2002

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering


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