Degradation Processes and Aging in Quantum Dot Lasers on Silicon

Matteo Meneghini; Matteo Buffolo; Michele Zenari; Carlo De Santi; Robert W. Herrick; Chen Shang; Yating Wan; Kaiyin Feng; Eamonn Hughes; John Bowers; Gaudenzio Meneghesso; Enrico Zanoni

Degradation Processes and Aging in Quantum Dot Lasers on Silicon

Matteo Meneghini, Matteo Buffolo, Michele Zenari, Carlo De Santi, Robert W. Herrick, Chen Shang, Yating Wan, Kaiyin Feng, Eamonn Hughes, John Bowers, Gaudenzio Meneghesso, Enrico Zanoni

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We discuss the physical processes for the degradation of quantum-dot lasers epitaxially grown on silicon. Through combined electro-optical measurements and deep-level transient spectroscopy, we conclude a pathway to obtain significant improvement in device lifetime.

Original language	English (US)
Title of host publication	2023 Conference on Lasers and Electro-Optics, CLEO 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781957171258
State	Published - 2023
Event	2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States Duration: May 7 2023 → May 12 2023

Publication series

Name	2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference	2023 Conference on Lasers and Electro-Optics, CLEO 2023
Country/Territory	United States
City	San Jose
Period	05/7/23 → 05/12/23

ASJC Scopus subject areas

Artificial Intelligence
Computer Science Applications
Electronic, Optical and Magnetic Materials
Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Meneghini, M., Buffolo, M., Zenari, M., De Santi, C., Herrick, R. W., Shang, C., Wan, Y., Feng, K., Hughes, E., Bowers, J., Meneghesso, G., & Zanoni, E. (2023). Degradation Processes and Aging in Quantum Dot Lasers on Silicon. In 2023 Conference on Lasers and Electro-Optics, CLEO 2023 Article SM2J.1 (2023 Conference on Lasers and Electro-Optics, CLEO 2023). Institute of Electrical and Electronics Engineers Inc..

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title = "Degradation Processes and Aging in Quantum Dot Lasers on Silicon",

abstract = "We discuss the physical processes for the degradation of quantum-dot lasers epitaxially grown on silicon. Through combined electro-optical measurements and deep-level transient spectroscopy, we conclude a pathway to obtain significant improvement in device lifetime.",

author = "Matteo Meneghini and Matteo Buffolo and Michele Zenari and {De Santi}, Carlo and Herrick, {Robert W.} and Chen Shang and Yating Wan and Kaiyin Feng and Eamonn Hughes and John Bowers and Gaudenzio Meneghesso and Enrico Zanoni",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2023 {\textcopyright} 2023 The Author(s); 2023 Conference on Lasers and Electro-Optics, CLEO 2023 ; Conference date: 07-05-2023 Through 12-05-2023",

year = "2023",

language = "English (US)",

series = "2023 Conference on Lasers and Electro-Optics, CLEO 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 Conference on Lasers and Electro-Optics, CLEO 2023",

address = "United States",

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Meneghini, M, Buffolo, M, Zenari, M, De Santi, C, Herrick, RW, Shang, C, Wan, Y, Feng, K, Hughes, E, Bowers, J, Meneghesso, G & Zanoni, E 2023, Degradation Processes and Aging in Quantum Dot Lasers on Silicon. in 2023 Conference on Lasers and Electro-Optics, CLEO 2023., SM2J.1, 2023 Conference on Lasers and Electro-Optics, CLEO 2023, Institute of Electrical and Electronics Engineers Inc., 2023 Conference on Lasers and Electro-Optics, CLEO 2023, San Jose, United States, 05/7/23.

Degradation Processes and Aging in Quantum Dot Lasers on Silicon. / Meneghini, Matteo; Buffolo, Matteo; Zenari, Michele et al.
2023 Conference on Lasers and Electro-Optics, CLEO 2023. Institute of Electrical and Electronics Engineers Inc., 2023. SM2J.1 (2023 Conference on Lasers and Electro-Optics, CLEO 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Degradation Processes and Aging in Quantum Dot Lasers on Silicon

AU - Meneghini, Matteo

AU - Buffolo, Matteo

AU - Zenari, Michele

AU - De Santi, Carlo

AU - Herrick, Robert W.

AU - Shang, Chen

AU - Wan, Yating

AU - Feng, Kaiyin

AU - Hughes, Eamonn

AU - Bowers, John

AU - Meneghesso, Gaudenzio

AU - Zanoni, Enrico

PY - 2023

Y1 - 2023

N2 - We discuss the physical processes for the degradation of quantum-dot lasers epitaxially grown on silicon. Through combined electro-optical measurements and deep-level transient spectroscopy, we conclude a pathway to obtain significant improvement in device lifetime.

AB - We discuss the physical processes for the degradation of quantum-dot lasers epitaxially grown on silicon. Through combined electro-optical measurements and deep-level transient spectroscopy, we conclude a pathway to obtain significant improvement in device lifetime.

UR - http://www.scopus.com/inward/record.url?scp=85176312570&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85176312570

T3 - 2023 Conference on Lasers and Electro-Optics, CLEO 2023

BT - 2023 Conference on Lasers and Electro-Optics, CLEO 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2023 Conference on Lasers and Electro-Optics, CLEO 2023

Y2 - 7 May 2023 through 12 May 2023

ER -

Degradation Processes and Aging in Quantum Dot Lasers on Silicon

Abstract

Publication series

Conference

ASJC Scopus subject areas

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