Determining the growth mode of SrTiO3 (001) via pulsed laser deposition using in-situ X-ray reflectivity

John D. Ferguson; Gökhan Arikan; Aram Amassian; Darren Dale; Arthur R. Woll; Joel D. Brock

Determining the growth mode of SrTiO₃ (001) via pulsed laser deposition using in-situ X-ray reflectivity

John D. Ferguson, Gökhan Arikan, Aram Amassian, Darren Dale, Arthur R. Woll, Joel D. Brock

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English (US)
Title of host publication	Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes
Pages	463-477
Number of pages	15
State	Published - 2006
Externally published	Yes
Event	2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes - Boston, MA, United States Duration: Nov 27 2006 → Dec 1 2006

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	967
ISSN (Print)	0272-9172

Other

Other	2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes
Country/Territory	United States
City	Boston, MA
Period	11/27/06 → 12/1/06

ASJC Scopus subject areas

Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
General Materials Science

Cite this

Ferguson, J. D., Arikan, G., Amassian, A., Dale, D., Woll, A. R., & Brock, J. D. (2006). Determining the growth mode of SrTiO₃ (001) via pulsed laser deposition using in-situ X-ray reflectivity. In Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes (pp. 463-477). (Materials Research Society Symposium Proceedings; Vol. 967).

@inproceedings{cc3f0cc2315944a090b7a5c563d4caff,

title = "Determining the growth mode of SrTiO3 (001) via pulsed laser deposition using in-situ X-ray reflectivity",

author = "Ferguson, {John D.} and G{\"o}khan Arikan and Aram Amassian and Darren Dale and Woll, {Arthur R.} and Brock, {Joel D.}",

year = "2006",

language = "English (US)",

isbn = "9781604234350",

series = "Materials Research Society Symposium Proceedings",

pages = "463--477",

booktitle = "Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes",

note = "2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes ; Conference date: 27-11-2006 Through 01-12-2006",

}

Ferguson, JD, Arikan, G, Amassian, A, Dale, D, Woll, AR & Brock, JD 2006, Determining the growth mode of SrTiO₃ (001) via pulsed laser deposition using in-situ X-ray reflectivity. in Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes. Materials Research Society Symposium Proceedings, vol. 967, pp. 463-477, 2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes, Boston, MA, United States, 11/27/06.

Determining the growth mode of SrTiO₃ (001) via pulsed laser deposition using in-situ X-ray reflectivity. / Ferguson, John D.; Arikan, Gökhan; Amassian, Aram et al.
Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes. 2006. p. 463-477 (Materials Research Society Symposium Proceedings; Vol. 967).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Determining the growth mode of SrTiO3 (001) via pulsed laser deposition using in-situ X-ray reflectivity

AU - Ferguson, John D.

AU - Arikan, Gökhan

AU - Amassian, Aram

AU - Dale, Darren

AU - Woll, Arthur R.

AU - Brock, Joel D.

PY - 2006

Y1 - 2006

UR - http://www.scopus.com/inward/record.url?scp=55949092359&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:55949092359

SN - 9781604234350

T3 - Materials Research Society Symposium Proceedings

SP - 463

EP - 477

BT - Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes

T2 - 2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes

Y2 - 27 November 2006 through 1 December 2006

ER -