Diagnosis of Embedding Faults in Circuits

Monther Busbait; Mikhail Moshkov; Albina Moshkova; Vladimir Shevtchenko

doi:10.1007/978-3-031-39031-9_3

Diagnosis of Embedding Faults in Circuits

Monther Busbait^*, Mikhail Moshkov, Albina Moshkova, Vladimir Shevtchenko

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Abstract

In this chapter, we study decision trees for diagnosis faults that consist in embedding gates implementing functions from a fault basis into circuits. It is shown that, for arbitrary circuit and fault bases, the minimum depth of diagnostic decision trees in the worst case grows depending on the complexity of the circuits, either superpolynomially, or linearly, or is bounded from above by a constant.

Original language	English (US)
Title of host publication	Studies in Systems, Decision and Control
Publisher	Springer Science and Business Media Deutschland GmbH
Pages	43-51
Number of pages	9
DOIs	https://doi.org/10.1007/978-3-031-39031-9_3
State	Published - 2023

Publication series

Name	Studies in Systems, Decision and Control
Volume	493
ISSN (Print)	2198-4182
ISSN (Electronic)	2198-4190

ASJC Scopus subject areas

Computer Science (miscellaneous)
Control and Systems Engineering
Automotive Engineering
Social Sciences (miscellaneous)
Economics, Econometrics and Finance (miscellaneous)
Control and Optimization
Decision Sciences (miscellaneous)

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10.1007/978-3-031-39031-9_3

Cite this

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AU - Moshkov, Mikhail

AU - Moshkova, Albina

AU - Shevtchenko, Vladimir

PY - 2023

Y1 - 2023

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AB - In this chapter, we study decision trees for diagnosis faults that consist in embedding gates implementing functions from a fault basis into circuits. It is shown that, for arbitrary circuit and fault bases, the minimum depth of diagnostic decision trees in the worst case grows depending on the complexity of the circuits, either superpolynomially, or linearly, or is bounded from above by a constant.

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M3 - Chapter

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T3 - Studies in Systems, Decision and Control

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EP - 51

BT - Studies in Systems, Decision and Control

PB - Springer Science and Business Media Deutschland GmbH

ER -

Diagnosis of Embedding Faults in Circuits

Abstract

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ASJC Scopus subject areas

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