Differential interference contrast x-ray microscopy with submicron resolution

Thomas Wilhein; Burkhard Kaulich; Enzo Di Fabrizio; Fillipo Romanato; Stefano Cabrini; Jean Susini

doi:10.1063/1.1360776

Differential interference contrast x-ray microscopy with submicron resolution

Thomas Wilhein^*, Burkhard Kaulich, Enzo Di Fabrizio, Fillipo Romanato, Stefano Cabrini, Jean Susini

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

88 Scopus citations

Abstract

Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy.

Original language	English (US)
Pages (from-to)	2082-2084
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	14
DOIs	https://doi.org/10.1063/1.1360776
State	Published - Apr 2 2001
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1360776

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abstract = "Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy.",

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AU - Kaulich, Burkhard

AU - Di Fabrizio, Enzo

AU - Romanato, Fillipo

AU - Cabrini, Stefano

AU - Susini, Jean

PY - 2001/4/2

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N2 - Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy.

AB - Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy.

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Differential interference contrast x-ray microscopy with submicron resolution

Abstract

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