Abstract
We present a complete description of "topological darkness" in a threedimensional space regarding optical constants (i.e., n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.
Original language | English (US) |
---|---|
Title of host publication | 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1-2 |
Number of pages | 2 |
ISBN (Print) | 9781943580279 |
DOIs | |
State | Published - Oct 25 2017 |
Externally published | Yes |