Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures

Dan You; Zhiyong Liu; Zaibing Guo; Yuankai Zheng; Yihong Wu

doi:10.1109/INTMAG.2002.1001215

Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures

Dan You, Zhiyong Liu, Zaibing Guo, Yuankai Zheng, Yihong Wu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

There has been much interest in nano-patterning of hard and soft magnetic materials and perpendicular recording media using the FIB technique, but very few of them has been focused on the milling process and its effect on the magnetic properties of the patterned nanostructures. In this work, the FIB patterning of commercial post-sputtering longitudinal media has been performed with emphasis on how the redeposition would affect the morphology of the patterned structure as well as its magnetic properties. The former was studied using AFM and the latter by MFM.

Original language	English (US)
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Editors	J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1001215
State	Published - 2002
Externally published	Yes
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

Publication series

Name	INTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	04/28/02 → 05/2/02

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering
Surfaces, Coatings and Films

Access to Document

10.1109/INTMAG.2002.1001215

Cite this

You, D., Liu, Z., Guo, Z., Zheng, Y., & Wu, Y. (2002). Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, & R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference Article 1001215 (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001215

You, Dan ; Liu, Zhiyong ; Guo, Zaibing et al. / Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures. INTERMAG Europe 2002 - IEEE International Magnetics Conference. editor / J. Fidler ; B. Hillebrands ; C. Ross ; D. Weller ; L. Folks ; E. Hill ; M. Vazquez Villalabeitia ; J. A. Bain ; Jo De Boeck ; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

@inproceedings{27c6b2f7e846416293e5ace18f37d355,

title = "Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures",

abstract = "There has been much interest in nano-patterning of hard and soft magnetic materials and perpendicular recording media using the FIB technique, but very few of them has been focused on the milling process and its effect on the magnetic properties of the patterned nanostructures. In this work, the FIB patterning of commercial post-sputtering longitudinal media has been performed with emphasis on how the redeposition would affect the morphology of the patterned structure as well as its magnetic properties. The former was studied using AFM and the latter by MFM.",

author = "Dan You and Zhiyong Liu and Zaibing Guo and Yuankai Zheng and Yihong Wu",

note = "Publisher Copyright: {\textcopyright}2002 IEEE.; 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 ; Conference date: 28-04-2002 Through 02-05-2002",

year = "2002",

doi = "10.1109/INTMAG.2002.1001215",

language = "English (US)",

series = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

editor = "J. Fidler and B. Hillebrands and C. Ross and D. Weller and L. Folks and E. Hill and {Vazquez Villalabeitia}, M. and Bain, {J. A.} and {De Boeck}, Jo and R. Wood",

booktitle = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",

address = "United States",

}

You, D, Liu, Z, Guo, Z, Zheng, Y & Wu, Y 2002, Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures. in J Fidler, B Hillebrands, C Ross, D Weller, L Folks, E Hill, M Vazquez Villalabeitia, JA Bain, J De Boeck & R Wood (eds), INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1001215, INTERMAG Europe 2002 - IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 04/28/02. https://doi.org/10.1109/INTMAG.2002.1001215

Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures. / You, Dan; Liu, Zhiyong; Guo, Zaibing et al.
INTERMAG Europe 2002 - IEEE International Magnetics Conference. ed. / J. Fidler; B. Hillebrands; C. Ross; D. Weller; L. Folks; E. Hill; M. Vazquez Villalabeitia; J. A. Bain; Jo De Boeck; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. 1001215 (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures

AU - You, Dan

AU - Liu, Zhiyong

AU - Guo, Zaibing

AU - Zheng, Yuankai

AU - Wu, Yihong

PY - 2002

Y1 - 2002

N2 - There has been much interest in nano-patterning of hard and soft magnetic materials and perpendicular recording media using the FIB technique, but very few of them has been focused on the milling process and its effect on the magnetic properties of the patterned nanostructures. In this work, the FIB patterning of commercial post-sputtering longitudinal media has been performed with emphasis on how the redeposition would affect the morphology of the patterned structure as well as its magnetic properties. The former was studied using AFM and the latter by MFM.

AB - There has been much interest in nano-patterning of hard and soft magnetic materials and perpendicular recording media using the FIB technique, but very few of them has been focused on the milling process and its effect on the magnetic properties of the patterned nanostructures. In this work, the FIB patterning of commercial post-sputtering longitudinal media has been performed with emphasis on how the redeposition would affect the morphology of the patterned structure as well as its magnetic properties. The former was studied using AFM and the latter by MFM.

UR - http://www.scopus.com/inward/record.url?scp=85017230902&partnerID=8YFLogxK

U2 - 10.1109/INTMAG.2002.1001215

DO - 10.1109/INTMAG.2002.1001215

M3 - Conference contribution

AN - SCOPUS:85017230902

T3 - INTERMAG Europe 2002 - IEEE International Magnetics Conference

BT - INTERMAG Europe 2002 - IEEE International Magnetics Conference

A2 - Fidler, J.

A2 - Hillebrands, B.

A2 - Ross, C.

A2 - Weller, D.

A2 - Folks, L.

A2 - Hill, E.

A2 - Vazquez Villalabeitia, M.

A2 - Bain, J. A.

A2 - De Boeck, Jo

A2 - Wood, R.

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002

Y2 - 28 April 2002 through 2 May 2002

ER -

You D, Liu Z, Guo Z, Zheng Y, Wu Y. Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures. In Fidler J, Hillebrands B, Ross C, Weller D, Folks L, Hill E, Vazquez Villalabeitia M, Bain JA, De Boeck J, Wood R, editors, INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2002. 1001215. (INTERMAG Europe 2002 - IEEE International Magnetics Conference). doi: 10.1109/INTMAG.2002.1001215

Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures

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