TY - JOUR
T1 - Effects of thermal annealing upon the nanomorphology of poly(3-hexylselenophene)-PCBM blends
AU - Lilliu, Samuele
AU - Agostinelli, Tiziano
AU - Verploegen, Eric
AU - Pires, Ellis
AU - Hampton, Mark
AU - Al-Hashimi, Mohammed
AU - Heeney, Martin J.
AU - Toney, Michael F.
AU - Nelson, Jenny
AU - MacDonald, J. Emyr
N1 - Generated from Scopus record by KAUST IRTS on 2023-02-14
PY - 2011/9/15
Y1 - 2011/9/15
N2 - Grazing incidence X-ray diffraction (GI-XRD) is used to characterize the crystallographic dynamics of low molecular weight (LMW) and high molecular weight (HMW) poly(3-hexylselenophene) (P3HS) films and blend films of P3HS with [6-6-]-phenyl-C 61-butyric acid methyl ester (PCBM) as a function of 'step-by-step' thermal annealing, from room temperature to 250 °C. The temperature-dependent GIXRD data show how the melting point of P3HS crystallites is decreased by the presence of PCBM. P3HS crystallite domain sizes dramatically increase upon annealing to the P3HS melting temperature. The formation of well-oriented HMW P3HS crystallites with the (100) plane parallel to the substrate (edge-on orientation), when cooled from melt, are observed. We compare the behaviour of P3HS pure and blend films with that of poly(3-hexyl)thiophene (P3HT) pure and PCBM blended films and suggest that the similar temperature dependent behaviour we observe may be a common to polythiophene and related polymers and their blends. The crystallographic dynamics of low molecular weight (LMW) and high molecular weight (HMW) poly(3-hexylselenophene) (P3HS) and phenyl-C 61-butyric acid methyl ester (PCBM) film bulk heterojunction (BHJ) has been characterized by GI-XRD, during in situ 'step-by-step' thermal annealing from room temperature to 250°C. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
AB - Grazing incidence X-ray diffraction (GI-XRD) is used to characterize the crystallographic dynamics of low molecular weight (LMW) and high molecular weight (HMW) poly(3-hexylselenophene) (P3HS) films and blend films of P3HS with [6-6-]-phenyl-C 61-butyric acid methyl ester (PCBM) as a function of 'step-by-step' thermal annealing, from room temperature to 250 °C. The temperature-dependent GIXRD data show how the melting point of P3HS crystallites is decreased by the presence of PCBM. P3HS crystallite domain sizes dramatically increase upon annealing to the P3HS melting temperature. The formation of well-oriented HMW P3HS crystallites with the (100) plane parallel to the substrate (edge-on orientation), when cooled from melt, are observed. We compare the behaviour of P3HS pure and blend films with that of poly(3-hexyl)thiophene (P3HT) pure and PCBM blended films and suggest that the similar temperature dependent behaviour we observe may be a common to polythiophene and related polymers and their blends. The crystallographic dynamics of low molecular weight (LMW) and high molecular weight (HMW) poly(3-hexylselenophene) (P3HS) and phenyl-C 61-butyric acid methyl ester (PCBM) film bulk heterojunction (BHJ) has been characterized by GI-XRD, during in situ 'step-by-step' thermal annealing from room temperature to 250°C. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
UR - https://onlinelibrary.wiley.com/doi/10.1002/marc.201100330
UR - http://www.scopus.com/inward/record.url?scp=80052527472&partnerID=8YFLogxK
U2 - 10.1002/marc.201100330
DO - 10.1002/marc.201100330
M3 - Article
SN - 1022-1336
VL - 32
SP - 1454
EP - 1460
JO - Macromolecular Rapid Communications
JF - Macromolecular Rapid Communications
IS - 18
ER -