TY - GEN
T1 - Efficient stochastic EMC/EMI analysis using HDMR-generated surrogate models
AU - Yücel, Abdulkadir C.
AU - Bagci, Hakan
AU - Michielssen, Eric
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2011/8
Y1 - 2011/8
N2 - Stochastic methods have been used extensively to quantify effects due to uncertainty in system parameters (e.g. material, geometrical, and electrical constants) and/or excitation on observables pertinent to electromagnetic compatibility and interference (EMC/EMI) analysis (e.g. voltages across mission-critical circuit elements) [1]. In recent years, stochastic collocation (SC) methods, especially those leveraging generalized polynomial chaos (gPC) expansions, have received significant attention [2, 3]. SC-gPC methods probe surrogate models (i.e. compact polynomial input-output representations) to statistically characterize observables. They are nonintrusive, that is they use existing deterministic simulators, and often cost only a fraction of direct Monte-Carlo (MC) methods. Unfortunately, SC-gPC-generated surrogate models often lack accuracy (i) when the number of uncertain/random system variables is large and/or (ii) when the observables exhibit rapid variations. © 2011 IEEE.
AB - Stochastic methods have been used extensively to quantify effects due to uncertainty in system parameters (e.g. material, geometrical, and electrical constants) and/or excitation on observables pertinent to electromagnetic compatibility and interference (EMC/EMI) analysis (e.g. voltages across mission-critical circuit elements) [1]. In recent years, stochastic collocation (SC) methods, especially those leveraging generalized polynomial chaos (gPC) expansions, have received significant attention [2, 3]. SC-gPC methods probe surrogate models (i.e. compact polynomial input-output representations) to statistically characterize observables. They are nonintrusive, that is they use existing deterministic simulators, and often cost only a fraction of direct Monte-Carlo (MC) methods. Unfortunately, SC-gPC-generated surrogate models often lack accuracy (i) when the number of uncertain/random system variables is large and/or (ii) when the observables exhibit rapid variations. © 2011 IEEE.
UR - http://hdl.handle.net/10754/564410
UR - http://ieeexplore.ieee.org/document/6050759/
UR - http://www.scopus.com/inward/record.url?scp=81255154031&partnerID=8YFLogxK
U2 - 10.1109/URSIGASS.2011.6050759
DO - 10.1109/URSIGASS.2011.6050759
M3 - Conference contribution
SN - 9781424451173
BT - 2011 XXXth URSI General Assembly and Scientific Symposium
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -