Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Jennifer L.M. Rupp; Patrick Reinhard; Daniele Pergolesi; Thomas Ryll; Rene Tölke; Enrico Traversa

doi:10.1063/1.3663529

Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Jennifer L.M. Rupp^*, Patrick Reinhard, Daniele Pergolesi, Thomas Ryll, Rene Tölke, Enrico Traversa

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O _3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

Original language	English (US)
Article number	012101
Journal	Applied Physics Letters
Volume	100
Issue number	1
DOIs	https://doi.org/10.1063/1.3663529
State	Published - Jan 2 2012
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films",

abstract = "Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.",

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T1 - Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

AU - Rupp, Jennifer L.M.

AU - Reinhard, Patrick

AU - Pergolesi, Daniele

AU - Ryll, Thomas

AU - Tölke, Rene

AU - Traversa, Enrico

PY - 2012/1/2

Y1 - 2012/1/2

N2 - Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

AB - Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

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DO - 10.1063/1.3663529

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Abstract

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