Electrical stability of PLEDs

Yap Boon Kar, Donal Bradley

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data. ©2010 IEEE.
Original languageEnglish (US)
Title of host publication2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings
StatePublished - Dec 1 2010
Externally publishedYes


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