Electron and x-ray diffraction study of ZnTe-ZnS strained-layer superlattices grown by molecular beam epitaxy

Takeshi Karasawa; Kazuhiro Ohkawa; Tsuneo Mitsuyu

doi:10.1063/1.101224

Electron and x-ray diffraction study of ZnTe-ZnS strained-layer superlattices grown by molecular beam epitaxy

Takeshi Karasawa^*, Kazuhiro Ohkawa, Tsuneo Mitsuyu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Reflection high-energy electron diffraction observation during the growth of ZnTe-ZnS strained-layer superlattices shows that sharp streaks of the substrate were replaced by a spotty pattern which eventually elongated into streaks. X-ray diffraction data of the superlattice with small period show satellite peaks around an intense central peak. These studies indicate a good superlattice structure for the samples with small (<50 Å) periods.

Original language	English (US)
Pages (from-to)	117-119
Number of pages	3
Journal	Applied Physics Letters
Volume	54
Issue number	2
DOIs	https://doi.org/10.1063/1.101224
State	Published - 1989
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.101224

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title = "Electron and x-ray diffraction study of ZnTe-ZnS strained-layer superlattices grown by molecular beam epitaxy",

abstract = "Reflection high-energy electron diffraction observation during the growth of ZnTe-ZnS strained-layer superlattices shows that sharp streaks of the substrate were replaced by a spotty pattern which eventually elongated into streaks. X-ray diffraction data of the superlattice with small period show satellite peaks around an intense central peak. These studies indicate a good superlattice structure for the samples with small (<50 {\AA}) periods.",

author = "Takeshi Karasawa and Kazuhiro Ohkawa and Tsuneo Mitsuyu",

year = "1989",

doi = "10.1063/1.101224",

language = "English (US)",

volume = "54",

pages = "117--119",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "AMER INST PHYSICS",

number = "2",

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T1 - Electron and x-ray diffraction study of ZnTe-ZnS strained-layer superlattices grown by molecular beam epitaxy

AU - Karasawa, Takeshi

AU - Ohkawa, Kazuhiro

AU - Mitsuyu, Tsuneo

PY - 1989

Y1 - 1989

N2 - Reflection high-energy electron diffraction observation during the growth of ZnTe-ZnS strained-layer superlattices shows that sharp streaks of the substrate were replaced by a spotty pattern which eventually elongated into streaks. X-ray diffraction data of the superlattice with small period show satellite peaks around an intense central peak. These studies indicate a good superlattice structure for the samples with small (<50 Å) periods.

AB - Reflection high-energy electron diffraction observation during the growth of ZnTe-ZnS strained-layer superlattices shows that sharp streaks of the substrate were replaced by a spotty pattern which eventually elongated into streaks. X-ray diffraction data of the superlattice with small period show satellite peaks around an intense central peak. These studies indicate a good superlattice structure for the samples with small (<50 Å) periods.

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U2 - 10.1063/1.101224

DO - 10.1063/1.101224

M3 - Article

AN - SCOPUS:0009423858

SN - 0003-6951

VL - 54

SP - 117

EP - 119

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 2

ER -

Electron and x-ray diffraction study of ZnTe-ZnS strained-layer superlattices grown by molecular beam epitaxy

Abstract

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