Electronic mobility in the high-carrier-density limit of ion gel gated IDTBT thin film transistors

Bei Bao, Xian Yi Shao, Lu Tan, Wen He Wang, Yue Shen Wu, Li Bin Wen, Jia Qing Zhao, Wei Tang, Wei Min Zhang, Xiao Jun Guo*, Shun Wang, Ying Liu

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Chemical Engineering