Estimation of capacitive crosstalk-induced short-circuit energy

Mosin Mondal; Sami Kirolos; Yehia Massoud

doi:10.1109/iscas.2007.378070

Estimation of capacitive crosstalk-induced short-circuit energy

Mosin Mondal, Sami Kirolos, Yehia Massoud

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%. © 2007 IEEE.

Original language	English (US)
Title of host publication	Proceedings - IEEE International Symposium on Circuits and Systems
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	897-900
Number of pages	4
DOIs	https://doi.org/10.1109/iscas.2007.378070
State	Published - Jan 1 2007
Externally published	Yes

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10.1109/iscas.2007.378070

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title = "Estimation of capacitive crosstalk-induced short-circuit energy",

abstract = "In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%. {\textcopyright} 2007 IEEE.",

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AU - Kirolos, Sami

AU - Massoud, Yehia

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PY - 2007/1/1

Y1 - 2007/1/1

N2 - In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%. © 2007 IEEE.

AB - In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%. © 2007 IEEE.

UR - http://ieeexplore.ieee.org/document/4252780/

UR - http://www.scopus.com/inward/record.url?scp=34548853172&partnerID=8YFLogxK

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M3 - Conference contribution

SP - 897

EP - 900

BT - Proceedings - IEEE International Symposium on Circuits and Systems

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Estimation of capacitive crosstalk-induced short-circuit energy

Abstract

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