Fabrication of magnetic force microscopy probes via localized electrochemical deposition of cobalt

Marco Rolandi*, David Okawa, Scott A. Backer, Alex Zettl, Jean Frechet

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Magnetic force microscopy probes were obtained via the solution phase electrochemical deposition of cobalt nanostructures at the probe apexes. Single tips were fabricated in an atomic force microscope fluid cell. Multiple tips were produced in a single batch with an alternating potential in an electrochemical cell. The probes achieve 50 nm spatial resolution.

Original languageEnglish (US)
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume25
Issue number5
DOIs
StatePublished - Sep 28 2007

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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