Fast non-contact surface roughness measurements up to the micrometer range by dual-wavelength digital holographic microscopy

Jonas Kühn*, Eduardo Solanas, Sébastien Bourquin, Jean François Blaser, Luca Dorigatti, Thierry Keist, Yves Emery, Christian Depeursinge

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

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Engineering

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Material Science