TY - JOUR
T1 - Film stresses and electrode buckling in organic solar cells
AU - Brand, Vitali
AU - Levi, Kemal
AU - McGehee, Michae D.
AU - Dauskardt, Reinhold H.
N1 - KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): KUS-C1-015-21
Acknowledgements: This work was partly supported by the Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division of the US Department of Energy, under Contract no. DE-FG02-07ER46391 and by the Center for Advanced Molecular Photovoltaics (CAMP) supported by King Abdullah University of Science and Technology (KAUST) under Award no. KUS-C1-015-21.
This publication acknowledges KAUST support, but has no KAUST affiliated authors.
PY - 2012/8
Y1 - 2012/8
N2 - We investigate the film stresses that develop in the polymer films and metal electrodes of poly(3-hexyl thiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methyl ester (PCBM) bulk heterojunction (BHJ) organic solar cells. A compressive biaxial stress of ∼-36 MPa was measured in PEDOT:PSS while a tensile stress of ∼6 MPa was measured in the BHJ layer. We then analyze the effect of electrode deposition rate on the film stresses in the Al electrode. Compressive stresses of ∼-100 to -145 MPa in the Al electrode lead to a buckling instability resulting in undulating electrode surface topography. The BHJ layer was found to have the lowest cohesion (∼1.5-1.8 J/m 2) among the layers of the solar cell and dependent on the Al electrode deposition rate. The cohesive failure path in the BHJ layer exhibited the same periodicity and orientation of the Al electrode buckling topography. We discuss the implications of the film stresses on damage processes during device fabrication and operation. © 2012 Elsevier B.V. All rights reserved.
AB - We investigate the film stresses that develop in the polymer films and metal electrodes of poly(3-hexyl thiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methyl ester (PCBM) bulk heterojunction (BHJ) organic solar cells. A compressive biaxial stress of ∼-36 MPa was measured in PEDOT:PSS while a tensile stress of ∼6 MPa was measured in the BHJ layer. We then analyze the effect of electrode deposition rate on the film stresses in the Al electrode. Compressive stresses of ∼-100 to -145 MPa in the Al electrode lead to a buckling instability resulting in undulating electrode surface topography. The BHJ layer was found to have the lowest cohesion (∼1.5-1.8 J/m 2) among the layers of the solar cell and dependent on the Al electrode deposition rate. The cohesive failure path in the BHJ layer exhibited the same periodicity and orientation of the Al electrode buckling topography. We discuss the implications of the film stresses on damage processes during device fabrication and operation. © 2012 Elsevier B.V. All rights reserved.
UR - http://hdl.handle.net/10754/598326
UR - https://linkinghub.elsevier.com/retrieve/pii/S0927024812001596
UR - http://www.scopus.com/inward/record.url?scp=84860530584&partnerID=8YFLogxK
U2 - 10.1016/j.solmat.2012.04.003
DO - 10.1016/j.solmat.2012.04.003
M3 - Article
SN - 0927-0248
VL - 103
SP - 80
EP - 85
JO - Solar Energy Materials and Solar Cells
JF - Solar Energy Materials and Solar Cells
ER -