@inproceedings{5aa6101f5bc04f3aa093f7268f9af73c,
title = "Full-scale exfoliation of InGaN-based light-eMitting diodes via Microcavity-assisted crack propagation by using tensile-stressed Ni layers",
abstract = "We demonstrated microcavity-assisted crack propagation for the full-scale exfoliation of a InGaN-based light-emitting diode (LED) membrane by using nanoporous structures and tensile-stressed Ni layers. The blue LED membrane was transferred on a glass slide by using an adhesive bonding and showed good performance.",
author = "Min, {Jung Hong} and Jeong, {Tae Hoon} and Lee, {Kwang Jae} and Min, {Jung Wook} and Park, {Tae Yong} and Ng, {Tien Khee} and Ooi, {Boon S.}",
note = "Publisher Copyright: {\textcopyright} 2022 IEICE.; 28th International Semiconductor Laser Conference, ISLC 2022 ; Conference date: 16-10-2022 Through 19-10-2022",
year = "2022",
doi = "10.23919/ISLC52947.2022.9943440",
language = "English (US)",
series = "Conference Digest - IEEE International Semiconductor Laser Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2022 28th International Semiconductor Laser Conference, ISLC 2022",
address = "United States",
}