Full-scale exfoliation of InGaN-based light-eMitting diodes via Microcavity-assisted crack propagation by using tensile-stressed Ni layers

Jung Hong Min, Tae Hoon Jeong, Kwang Jae Lee, Jung Wook Min, Tae Yong Park, Tien Khee Ng, Boon S. Ooi*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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