Abstract
We report a method in making transmission electron microscopy sample for both CVD-grown and exfoliated 2D materials without etching process, thus gentle to those 2D materials that are sensitive to water and reactive etchants. Large-scale WS2 monolayer grown on glass, NbS2 atomic layers grown on exfoliated h-BN flakes, and water-sensitive exfoliated TiS2 flakes are given as representative examples. We show that the as-transferred samples not only retain excellent structural integrity down to atomic scale but also have little oxidations, presumably due to the minimum contact with water/etchants. This method paves the way for atomic scale structural and chemical investigations in sensitive 2D materials.
Original language | English (US) |
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Pages (from-to) | 116108 |
Journal | APL MATERIALS |
Volume | 4 |
Issue number | 11 |
DOIs | |
State | Published - Nov 21 2016 |
Externally published | Yes |
ASJC Scopus subject areas
- General Engineering
- General Materials Science